发明名称 SEMICONDUCTOR PACKAGE AND FABRICATION METHOD THEREOF
摘要 A semiconductor package is provided, which includes: a circuit structure having a first bottom surface and a first top surface opposite to the first bottom surface; at least a semiconductor element disposed on the first top surface of the circuit structure and electrically connected to the circuit structure; an encapsulant formed on the first top surface of the circuit structure to encapsulate the semiconductor element, wherein the encapsulant has a second bottom surface facing the first top surface of the circuit structure and a second top surface opposite to the second bottom surface; and a strengthening layer formed on the second top surface of the encapsulant, or formed between the circuit structure and the encapsulant, or formed on the first bottom surface of the circuit structure, thereby effectively preventing the encapsulant from warping and the semiconductor element from cracking.
申请公布号 US2016141255(A1) 申请公布日期 2016.05.19
申请号 US201514824570 申请日期 2015.08.12
申请人 Siliconware Precision Industries Co., Ltd. 发明人 Lu Hui-Chuan;Lu Chun-Hung;Wu Po-Yi
分类号 H01L23/00;H01L21/56;H01L21/48;H01L21/54;H01L23/498;H01L23/31 主分类号 H01L23/00
代理机构 代理人
主权项 1. A semiconductor package, comprising: a circuit structure having a first bottom surface and a first top surface opposite to the first bottom surface; at least a semiconductor element disposed on the first top surface of the circuit structure and electrically connected to the circuit structure; an encapsulant formed on the first top surface of the circuit structure to encapsulate the semiconductor element, wherein the encapsulant has a second bottom surface facing the first top surface of the circuit structure and a second top surface opposite to the second bottom surface; and a strengthening layer formed on the second top surface of the encapsulant, or formed between the circuit structure and the encapsulant, or formed on the first bottom surface of the circuit structure.
地址 Taichung TW