发明名称 GRAPHENE-COATED ATOMIC FORCE MICROSCOPE PROBE AND MANUFACTURING METHOD THEREFOR AND APPLICATION THEREOF
摘要 A graphene-coated atomic force microscope probe and a manufacturing method therefor and an application thereof. The graphene-coated atomic force microscope probe includes a probe base, a cantilever and a tip. The cantilever and the tip are provided with a metal layer, and the tip is further provided with a graphene layer. The manufacturing method for the graphene-coated atomic force microscope probe comprises the following steps: (1) preparing the graphene solution: adding 5-10 mg of graphene into 1mL of water, and performing the ultrasonic dispersion for 10 min in an ultrasonic wave cleaner to obtain 5-10mg/mL of graphene solution; (2) preparing the graphene-coated atomic force microscope probe: immersing the tip of the atomic force microscope probe with the metal layer on the cantilever and the tip, into the graphene solution of step (1), and stirring mechanically for 30-60s, and then extracting the probe to dry naturally.
申请公布号 WO2016074305(A1) 申请公布日期 2016.05.19
申请号 WO2014CN93684 申请日期 2014.12.12
申请人 ZHANGJIAGANG INSTITUTE OF INDUSTRIAL TECHNOLOGIES, SOOCHOW UNIVERSITY 发明人 HUI, FEI;LANZA, MATIO;SHI, YUANYUAN
分类号 G01Q60/40 主分类号 G01Q60/40
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