发明名称 AUTOMATIC ANALYZER
摘要 PROBLEM TO BE SOLVED: To solve the problem that: when an operator checks information on result of measurement of a specimen, since all the information cannot simultaneously be displayed in a limited display area, a plurality of types of detailed information on the result of measurement are required to be checked while opening and closing of a slave screen and screen transition are repeated, which leads to a large number of screen operation steps, and therefore increasing burden on the operator; in particular, when abnormality has occurred in the result of measurement, quick response is not possible when checking the detailed information to investigate cause of the abnormality.SOLUTION: An automatic analyzer changes display width of screen display components and an amount of information to be displayed on the display components according to degree of details of information which an operator intends to check, so as to display specimen information, result of measurement, and detailed information on the result of measurement simultaneously without displaying the pieces of information in a limited display area while overlapping a slave screen thereon.SELECTED DRAWING: Figure 2
申请公布号 JP2016085233(A) 申请公布日期 2016.05.19
申请号 JP20160029461 申请日期 2016.02.19
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ORIHASHI TOSHIHIDE;TAKANO MASAKI;MIYAGI MARIKO;TOKUNAGA TATSUYA
分类号 G01N35/00 主分类号 G01N35/00
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