| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that prevents a test from being passed, which, when a failure is found in a memory cell, gives a test result according to an expected value in testing irrespective of no potential difference in a bit line pair.SOLUTION: A word line WL is connected to a mask ROM memory cell CL, and a bit line pair Bit, Bitn is connected to the memory cell CL. A differential sense amplifier 503 amplifies a potential difference of the bit line pair Bit, Bitn. A logical circuit 505 detects coincidence or non-coincidence of logical states of the bit line pair Bit, Bitn.SELECTED DRAWING: Figure 1 |
