发明名称 SHAPE MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a shape measurement device in which, plural probes can be exchanged easily and stably, and impact is avoided.SOLUTION: A shape measurement device measures roughness and/or contour of a workpiece surface, by sliding a tracer disposed on a tip side of an arm 30, to an axial direction of the arm with respect to the workpiece, in which the arm comprises an engagement mechanism 52 which detachably attaches the tracer side of the arm to a base end side of the arm. The engagement mechanism comprises two engagement faces 62, 82 which face vertically to the workpiece surface and in parallel to the axial direction of the arm, and absorbs each other by a magnet 90 and a magnetization member 68 which are disposed on corresponding positions of the engagement faces. The engagement face has a getting-on part where the arm on the tracer side gets on to the arm on the base end side, and when the arm on the tracer side presses or pulls the arm on the base end side, the arm on the tracer side slides on a face of the getting-on part and gets on, and is deviated from the arm on the base end part.SELECTED DRAWING: Figure 3
申请公布号 JP2016085204(A) 申请公布日期 2016.05.19
申请号 JP20150130664 申请日期 2015.06.30
申请人 TOKYO SEIMITSU CO LTD 发明人 YAMAUCHI YASUHIRO
分类号 G01B5/28;G01B5/00 主分类号 G01B5/28
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