发明名称 NANOSCALE PROBE STRUCTURE AND APPLICATION THEREOF
摘要 A nanoscale probe structure, including: a first probe having a tip top end and a second probe having a planar top end, wherein a metallic layer coats the on the tip top end, an insulating layer coats around the tip top end of the first probe; and a metallic layer coats on the planar top end, an insulating layer coats around the planar top end of the second probe. The structure of present invention can applied in atomic force microscopy to measure the electricity physiology signal inside and outside the cell membrane, which can limit the measure region to specific little area for the measure of electricity physiology signal and effectively decrease the miscellaneous noise disturbance from other region.
申请公布号 US2016139177(A1) 申请公布日期 2016.05.19
申请号 US201514671235 申请日期 2015.03.27
申请人 National Tsing Hua University 发明人 Tseng Fan-Gang;Chen Yi-Chuan
分类号 G01Q70/14;C12Q1/42 主分类号 G01Q70/14
代理机构 代理人
主权项 1. A nanoscale probe structure, comprising: a first probe having a tip top end; and a second probe having a planar top end, wherein the tip top end is coated with a metallic layer, and the first probe is coated with an insulating layer around the tip top end; the planar top end is coated with a metallic layer, and the planar top end is coated with an insulating layer around the planar top end; and wherein the metallic layer on the first probe or the second probe is a platinum (Pt) metallic layer or a iridium (Ir) metallic layer.
地址 Hsinchu TW