| 摘要 |
PROBLEM TO BE SOLVED: To reduce a processing load without largely impairing diagnostic accuracy.SOLUTION: A diagnostic apparatus comprises: a failure candidate extraction unit which, on the basis of a test result obtained by individually giving a plurality of types of test patterns to an integrated circuit being a diagnostic object and actually operating the integrated circuit, extracts a failure candidate from among a plurality of elements forming the integrated circuit; a first path pattern extraction unit which, on the basis of log data obtained by performing simulation with the plurality of types of test patterns, extracts a path pattern propagating a signal to the failure candidate from among a plurality of path patterns showing the fact that a test result is normal, of the plurality of types of test patterns; and a failure simulation execution unit which executes failure simulation under assumption of failure in the failure candidate using a fail pattern showing the fact that a test result is abnormal and the extracted path pattern, of the plurality of types of test patterns.SELECTED DRAWING: Figure 4 |
