发明名称 二重拡散金属酸化膜半導体装置
摘要 A double-diffusion metal-oxide semiconductor (DMOS) device (100) is disclosed. The DMOS device (100) includes a substrate, a source region on the substrate, a gate region on the substrate, and a drain region on the substrate. The DMOS device (100) also includes a source metal layer (101) positioned on the source region and a gate metal layer (102) positioned on the gate region. The source metal layer (101) has a first pattern, the gate metal layer (102) has a second pattern, and the first pattern is different from the second pattern such that the source metal layer (101) can be distinguished from the gate metal layer (102) by packaging equipment based on the different first pattern and second pattern.
申请公布号 JP5918257(B2) 申请公布日期 2016.05.18
申请号 JP20130545020 申请日期 2011.11.29
申请人 無錫華潤上華半導体有限公司;無錫華潤上華科技有限公司 发明人 曹 健;趙 廣 艶;高 東 嶽
分类号 H01L29/41;H01L21/336;H01L21/60;H01L29/417;H01L29/78 主分类号 H01L29/41
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