| 摘要 |
A device for inspecting a surface of an electrically conductive part, the device having a plurality of eddy current probes arranged on a convex surface of the device together with an applicator for applying the probes against the surface to be inspected into which the device is inserted, wherein the probes are fastened on flexible strips extending beside one another in a longitudinal direction of the device, the applicator including a deformable material, that, on being compressed along the longitudinal direction, gives rise to expansion transversely to the longitudinal direction, the expansion deforming the strips so as to apply the probes against the surface. |
