发明名称 |
INTER-LEVEL CONNECTION FOR MULTI-LAYER STRUCTURES |
摘要 |
Provided are a system for manufacturing a semiconductor device structure and a method thereof. An exemplary semiconductor device structure includes a first device layer, a second device layer and an inter-level connection structure. The first device layer includes a first conductive layer and a first dielectric layer formed on the first conductive layer. The first device layer is formed on a substrate. The second device layer includes a second conductive layer. The second device layer is formed on the first device layer. The inter-level connection structure includes one or more conductive materials and is configured to be electrically connected to the first conductive layer and the second conductive layer. The inter-level connection structure penetrates at least a part of the first dielectric layer. The first conductive layer is configured to be electrically connected to a first electrode structure of a first semiconductor device within the first device layer. |
申请公布号 |
KR20160055760(A) |
申请公布日期 |
2016.05.18 |
申请号 |
KR20160054069 |
申请日期 |
2016.05.02 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIN YI TANG;WANN CLEMENT HSINGJEN;CHEN NENG KUO |
分类号 |
H01L21/8238;H01L21/768;H01L21/8228 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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