发明名称 INTER-LEVEL CONNECTION FOR MULTI-LAYER STRUCTURES
摘要 Provided are a system for manufacturing a semiconductor device structure and a method thereof. An exemplary semiconductor device structure includes a first device layer, a second device layer and an inter-level connection structure. The first device layer includes a first conductive layer and a first dielectric layer formed on the first conductive layer. The first device layer is formed on a substrate. The second device layer includes a second conductive layer. The second device layer is formed on the first device layer. The inter-level connection structure includes one or more conductive materials and is configured to be electrically connected to the first conductive layer and the second conductive layer. The inter-level connection structure penetrates at least a part of the first dielectric layer. The first conductive layer is configured to be electrically connected to a first electrode structure of a first semiconductor device within the first device layer.
申请公布号 KR20160055760(A) 申请公布日期 2016.05.18
申请号 KR20160054069 申请日期 2016.05.02
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN YI TANG;WANN CLEMENT HSINGJEN;CHEN NENG KUO
分类号 H01L21/8238;H01L21/768;H01L21/8228 主分类号 H01L21/8238
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