发明名称 窒化物半導体装置
摘要 A nitride semiconductor device includes: first electrode interconnect layers extending in parallel with one another over the nitride semiconductor layer and divided by areas extending across a longitudinal direction of the first electrode interconnect layers; first gate electrodes extending along the first electrode interconnect layers; first gate electrode connecting interconnects extending in associated ones of the areas dividing the first electrode interconnect layers and being in connection to the first gate electrodes; first electrode connecting interconnects formed above the first gate electrode connecting interconnects and being in connection to the first electrode interconnect layers; a first electrode upper interconnects formed on the first electrode connecting interconnects with an interconnect insulating film interposed therebetween, and being in connection to the first electrode connecting interconnects through associated ones of openings of the interconnect insulating film.
申请公布号 JP5919521(B2) 申请公布日期 2016.05.18
申请号 JP20130523776 申请日期 2012.06.05
申请人 パナソニックIPマネジメント株式会社 发明人 海原 一裕;按田 義治
分类号 H01L21/338;H01L21/3205;H01L21/337;H01L21/768;H01L23/522;H01L27/098;H01L29/41;H01L29/778;H01L29/808;H01L29/812 主分类号 H01L21/338
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