发明名称 偏光測定装置、偏光測定方法及び偏光光照射装置
摘要 The present invention is to provide a polarization axis detector which detects a polarization axis of polarized light with high precision even when luminance is frequently changed from a light source, a polarization measuring apparatus, a polarization measuring method, and a polarized light emitting apparatus. The polarization axis detector comprises: a first polarized light detecting unit (311) which includes a detection polarizer (311a) rotating for detecting a polarization axis and a first luminance sensor (311b) which detects luminance of the polarized light from a light source passing through the detection polarizer (311a); and a second polarized light detecting unit (312) which includes a second luminance sensor (312a) which directly detects luminance information of the polarized light from the light source and is provided in parallel with the first polarized light detecting unit (311). The polarization measuring apparatus calculates the polarization characteristics of polarized light from the light source on the basis of the luminance information detected in the first polarized light detecting unit (311) and the luminance information detected in the second polarized light detecting unit (312).
申请公布号 JP5920402(B2) 申请公布日期 2016.05.18
申请号 JP20140108892 申请日期 2014.05.27
申请人 ウシオ電機株式会社 发明人 吉田 啓二
分类号 G01N21/21 主分类号 G01N21/21
代理机构 代理人
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