发明名称 薄膜形成装置の洗浄方法、薄膜形成方法、及び、薄膜形成装置
摘要 PROBLEM TO BE SOLVED: To provide a method for cleaning a thin film forming device capable of reducing maintenance work and shortening downtime.SOLUTION: A method for cleaning a thin film forming device 1 comprises a heating step and a cleaning step. The heating step heats the inside of a reaction tube 2 to 800°C to 900°C. The cleaning step generates an active species containing an oxygen active species by supplying a cleaning gas containing an oxygen gas and a hydrogen gas into the reaction tube and heating the cleaning gas with the inside of the heated reaction tube maintained at 1.33 Pa to 2660 Pa, and removes a deposit attached to the inside of the thin film forming device 1 with the generated active species.
申请公布号 JP5918423(B2) 申请公布日期 2016.05.18
申请号 JP20150118314 申请日期 2015.06.11
申请人 東京エレクトロン株式会社 发明人 久保 万身;遠藤 篤史;水永 覚
分类号 H01L21/31;C23C16/27;C23C16/44 主分类号 H01L21/31
代理机构 代理人
主权项
地址