发明名称 レジスト組成物、レジストパターン形成方法及び高分子化合物
摘要 A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under the action of acid, the resist composition including a base component that exhibits changed solubility in a developing solution under the action of acid, the base component containing a resin component having a structural unit represented by general formula (a0-1) shown below: in which R1 represents a hydrogen atom or an alkyl group of 1 to 5 carbon atoms, R2 represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, and X represents an oxygen atom, a sulfur atom, or an alkylene group of 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom.
申请公布号 JP5919148(B2) 申请公布日期 2016.05.18
申请号 JP20120197774 申请日期 2012.09.07
申请人 東京応化工業株式会社 发明人 鈴木 祐輔;山田 知孝
分类号 G03F7/039;C08F220/38 主分类号 G03F7/039
代理机构 代理人
主权项
地址