发明名称 Semiconductor component with integrated crack sensor and method for detecting a crack in a semiconductor component
摘要 A first embodiment relates to a semiconductor component. The semiconductor component has a semiconductor body with a bottom side and a top side spaced distant from the bottom side in a vertical direction. In the vertical direction, the semiconductor body has a certain thickness. The semiconductor component further has a crack sensor configured to detect a crack in the semiconductor body. The crack sensor extends into the semiconductor body. A distance between the crack sensor and the bottom side is less than the thickness of the semiconductor body.
申请公布号 US9343381(B2) 申请公布日期 2016.05.17
申请号 US201313899906 申请日期 2013.05.22
申请人 Infineon Technologies AG 发明人 Zundel Markus;Schmalzbauer Uwe;Zelsacher Rudolf
分类号 H01L27/14;H01L21/66;H01L23/00 主分类号 H01L27/14
代理机构 Murphy, Bilak & Homiller, PLLC 代理人 Murphy, Bilak & Homiller, PLLC
主权项 1. A semiconductor component, comprising: a semiconductor body having a bottom side, a top side spaced distant from the bottom side in a vertical direction, and a thickness in the vertical direction; and a crack sensor configured to detect a crack in the semiconductor body, wherein the crack sensor extends into the semiconductor body,a distance between the crack sensor and the bottom side is less than the thickness of the semiconductor body,the crack sensor is partially or completely arranged in a trench formed in the semiconductor body.
地址 Neibiberg DE