发明名称 Dual-gate transistor control based on calibration circuitry
摘要 Disclosed are various embodiments related to dual-gate transistors and associated calibration circuitry. In one embodiment, dual-gate transistors may be configured in a sense amplifier arrangement, and calibration circuitry can be used to adjust an input offset of the sense amplifier. In another embodiment, a reference level voltage utilized in an amplifier with dual-gate transistors can be adjusted during a calibration sequence, and may be substantially unchanged from its nominal value outside of the calibration sequence. In another embodiment, a calibration sequence can be utilized to determine circuit results from a circuit including dual-gate transistors, and to adjust control gates to more closely coincide with expected or desired results. In yet another embodiment, a semiconductor memory device can include a memory array with amplifiers that include dual-gate transistors, as well as associated calibration circuitry.
申请公布号 US9344080(B1) 申请公布日期 2016.05.17
申请号 US201514667069 申请日期 2015.03.24
申请人 Stephens, Jr. Michael C. 发明人 Stephens, Jr. Michael C.
分类号 H03K17/296;H03K17/284;H03K17/30;H03K17/687 主分类号 H03K17/296
代理机构 代理人
主权项 1. A method of controlling dual-gate transistors, the method comprising: a) activating a calibration sequence having first and second phases in response to a calibration command signal; b) during the first phase, increasing a first data input at a signal gate of a first dual-gate transistor by an adjustment voltage, and storing a first result; c) during the second phase, decreasing the first data input, and storing a second result; and d) using the first and second results to set first and second control signals, wherein the first control signal is coupled to a control gate of the first dual-gate transistor, and the second control signal is coupled to a control gate of a second dual-gate transistor.
地址 Los Gatos CA US