发明名称 |
MEMORY DEVICES AND METHODS OF OPERATING THE MEMORY DEVICE |
摘要 |
To effectively generate a high inhibit voltage which is higher than an external power voltage applied to a memory device, the present disclosure relates to a method of operating the memory device including a plurality of memory cells which are arranged respectively in regions where first signal lines intersect with second signal lines. The method includes a step of applying an initial voltage to the first signal lines, a step of floating the first signal lines to which the initial voltage is applied, a step of applying a second inhibit voltage to the second signal lines, and a step of raising the voltage level of the first signal lines to a first inhibit voltage level, through capacitive coupling between the floated first signal lines and the second signal lines to which the second inhibit voltage is applied. |
申请公布号 |
KR20160055012(A) |
申请公布日期 |
2016.05.17 |
申请号 |
KR20140154738 |
申请日期 |
2014.11.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON, HYO JIN;LEE, YEONG TAEK;BYEON, DAE SEOK |
分类号 |
G11C13/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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