发明名称 Etchstop layers and capacitors
摘要 Capacitor structures for integrated circuit devices are provided. Capacitors include proximate dense or highly dense etchstop layers. The dense or highly dense etchstop layer is, for example, a high-k material. Capacitors are, for example, metal-insulator-metal (MIM) capacitors and are useful in DRAM (dynamic random access memory) and eDRAM (embedded dynamic random access memory) structures.
申请公布号 US9343524(B2) 申请公布日期 2016.05.17
申请号 US201514732593 申请日期 2015.06.05
申请人 Intel Corporation 发明人 Brain Ruth A.
分类号 H05K1/00;H01L49/02;H01L21/311;H01L23/522;G06F1/18;H01L21/768;H01L21/02;H01L23/532;H01L27/108 主分类号 H05K1/00
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. A semiconductor device comprising, a substrate having at least one dielectric layer disposed on the substrate surface; a first dielectric etchstop layer and a second dielectric etchstop layer disposed on the dielectric layer, wherein the second dielectric etchstop layer is disposed directly on the first dielectric etchstop layer; and a well formed through the first and second dielectric etchstop layers and in the at least one dielectric layer, wherein the well comprises inwardly tapered sidewalls and a bottom, and a first layer of conducting material is disposed on the inwardly tapered sidewalls and bottom of the well, an insulating layer disposed on the first layer of conducting material, and a second layer of conducting material disposed on the insulating layer.
地址 Santa Clara CA US