发明名称 |
Resistive random access memory and method of resetting a resistive random access memory |
摘要 |
According to another embodiment, a method of a reset operation for a RRAM is provided. The method includes the following operations: providing a first voltage to the dielectric side electrode of the resistor; and providing a second voltage to a gate of the transistor, wherein the first voltage in a second loop is lower than that in a first loop, and the second voltage in the second loop is higher than that in the first loop. |
申请公布号 |
US9343151(B1) |
申请公布日期 |
2016.05.17 |
申请号 |
US201514593075 |
申请日期 |
2015.01.09 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Tsai Chun-Yang;Ting Yu-Wei;Huang Kuo-Ching |
分类号 |
G11C11/00;G11C11/36;G11C13/00 |
主分类号 |
G11C11/00 |
代理机构 |
Jones Day |
代理人 |
Jones Day |
主权项 |
1. A resistive random access memory (RRAM), comprising:
a resistor comprising a cap side electrode and a dielectric side electrode; a transistor, a drain of the transistor electrically connected to the dielectric side electrode; a first voltage source electrically connected to a source of the transistor; and a second voltage source electrically connected to a gate of the transistor, wherein for a reset operation comprising at least two loops, the first voltage source provides a lower voltage in a second loop than the first voltage source does in a first loop, and the second voltage source provides a higher voltage in the second loop than the second voltage source does in the first loop. |
地址 |
Hsinchu TW |