发明名称 Resistive random access memory and method of resetting a resistive random access memory
摘要 According to another embodiment, a method of a reset operation for a RRAM is provided. The method includes the following operations: providing a first voltage to the dielectric side electrode of the resistor; and providing a second voltage to a gate of the transistor, wherein the first voltage in a second loop is lower than that in a first loop, and the second voltage in the second loop is higher than that in the first loop.
申请公布号 US9343151(B1) 申请公布日期 2016.05.17
申请号 US201514593075 申请日期 2015.01.09
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 Tsai Chun-Yang;Ting Yu-Wei;Huang Kuo-Ching
分类号 G11C11/00;G11C11/36;G11C13/00 主分类号 G11C11/00
代理机构 Jones Day 代理人 Jones Day
主权项 1. A resistive random access memory (RRAM), comprising: a resistor comprising a cap side electrode and a dielectric side electrode; a transistor, a drain of the transistor electrically connected to the dielectric side electrode; a first voltage source electrically connected to a source of the transistor; and a second voltage source electrically connected to a gate of the transistor, wherein for a reset operation comprising at least two loops, the first voltage source provides a lower voltage in a second loop than the first voltage source does in a first loop, and the second voltage source provides a higher voltage in the second loop than the second voltage source does in the first loop.
地址 Hsinchu TW