发明名称 |
Lamp failure detector |
摘要 |
Apparatus and methods for detecting lamp failure in a rapid thermal processing (RTP) tool are provided. Lamp failure detection systems are provided that can accommodate DC and/or AC voltages. The systems sample voltage signals along a circuit path formed by at least two serially connected lamps, calculate a voltage drop across the first lamp of the at least two serially connected lamps based on the sampled voltage signals, and determine whether a lamp failure has occurred based on a relationship between the voltage drop across the first lamp and a total voltage applied to the circuit path. |
申请公布号 |
US9345118(B2) |
申请公布日期 |
2016.05.17 |
申请号 |
US201414532895 |
申请日期 |
2014.11.04 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Serebryanov Oleg;Goldin Alexander |
分类号 |
H05B37/03 |
主分类号 |
H05B37/03 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. An apparatus for thermal processing of semiconductor substrates, comprising:
a chamber body having an opening; a lamphead assembly coupled to the opening of the chamber body, the lamphead assembly comprising a plurality of lamps arranged in an array; and a lamp failure detector electrically coupled to the lamphead assembly and comprising:
a voltage data acquisition module positioned to sample voltage signals on a circuit path formed by at least two serially connected lamps of the plurality of lamps;a first capacitor coupled to the circuit path at a first node associated with a first lamp of the at least two serially connected lamps and coupled to the voltage data acquisition module; anda second capacitor coupled to the circuit path at a second node associated with the first lamp of the at least two serially connected lamps and coupled to the voltage data acquisition module; and a controller adapted to receive digital values of the sampled voltage signals from the voltage data acquisition module, and to determine a status of one or more lamps of the at least two serially connected lamps based on a voltage drop across the first lamp of the at least two serially connected lamps, as determined by the sampled voltage signals, wherein the lamp failure detector further comprises a first resistor coupled between the first and second capacitors of the circuit path in parallel with the first lamp and a filter rectifier coupled to the first resistor, wherein the filter rectifier comprises a bridge rectifier having ends coupled in parallel with the first resistor, and wherein the filter rectifier further comprises a measurement capacitor coupled in parallel with taps of the bridge rectifier. |
地址 |
Santa Clara CA US |