发明名称 |
Semiconductor storage device |
摘要 |
A semiconductor storage device has a cell array, a redundant array provided logically separated from the cell array, a cache memory having a storing area of data read from or written in the cell array by one access, defective column storage to store a column address of a defective column in the cell array, a defective column determination module to determine whether a column address to be accessed matches the column address stored in the defective column storage, and a clock generator to generate a clock for accessing each of the divided areas for each period of the interleave access and, when the defective column determination module determines that there is a match, instead of a clock accessing a divided page buffer area at the generation timing of the clock accessing the divided page buffer area. |
申请公布号 |
US9343186(B2) |
申请公布日期 |
2016.05.17 |
申请号 |
US201414482697 |
申请日期 |
2014.09.10 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Komai Hiromitsu |
分类号 |
G06F12/00;G06F13/00;G11C29/00;G06F12/06 |
主分类号 |
G06F12/00 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P |
主权项 |
1. A semiconductor storage device comprising:
a cell array; a redundant array provided logically separated from the cell array, the redundant array comprising a column area replaceable with a defective column in the cell array; a cache memory comprising a storing area of data read from or written in the cell array by one access, the cache memory allowing interleave access to a plurality of divided areas to which the area is logically divided; a defective column storage to store a column address of a defective column in the cell array; a defective column determination module to determine whether a column address to be accessed matches the column address stored in the defective column storage; and a clock generator to generate a clock for accessing each of the divided areas for each period of the interleave access and, when the defective column determination module determines that there is a match, instead of a clock accessing a divided page buffer area that corresponds to the defective column, at the generation timing of the clock accessing the divided page buffer area, to generate a clock accessing the redundant array that has stored data of the defective column. |
地址 |
Minato-ku JP |