发明名称 Sense amplifier, semiconductor memory device using thereof and read method thereof
摘要 A sense amplifier is provided which includes a first load supplied with a selection cell current from a read bit line connected to a selected memory cell; a second load supplied with a reference current from a reference read bit line connected to a reference cell, a resistance value of the second load being different from a resistance value of the first load; and a sensing unit configured to correct a level of the reference current based on a resistance ratio of the first and second loads and to compare the selection cell current and the corrected reference current.
申请公布号 US9343138(B2) 申请公布日期 2016.05.17
申请号 US201414518485 申请日期 2014.10.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Antonyan Artur
分类号 G11C7/06;G11C11/4091;G11C11/4099 主分类号 G11C7/06
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A sense amplifier comprising: a first load supplied with a selection cell current from a read bit line connected to a selected memory cell; a second load supplied with a reference current from a reference read bit line connected to a reference cell, a resistance value of the second load being different from a resistance value of the first load; and a sensing unit configured to correct a level of the reference current based on a resistance ratio of the first and second loads and to compare the selection cell current and the corrected reference current, wherein the second load comprises a plurality of transistors, channels of the plurality of transistors being connected between an operation voltage source and the reference read bit line.
地址 Suwon-si KR