发明名称 |
REPAIR SYSTEM FOR SEMICONDUCTOR APPARATUS AND REPAIR METHOD USING THE SAME |
摘要 |
The present invention may include a tester which generates die classification information and memory repair data including a repair address and a command for performing a repair process; and a semiconductor device which receives the memory repair data and allows a die corresponding to the die classification information among dies to perform a repair operation according to the repair address and the command. So, the repair time can be reduced. |
申请公布号 |
KR20160054301(A) |
申请公布日期 |
2016.05.16 |
申请号 |
KR20140153732 |
申请日期 |
2014.11.06 |
申请人 |
SK HYNIX INC. |
发明人 |
YOU, JUNG TAEK;YOON, BYUNG KUK |
分类号 |
G11C29/04 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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