ABNORMAL SYSTEM TEST DATA GENERATING DEVICE, METHOD, AND PROGRAM, CAPABLE OF EFFICIENTLY COVERING SPECIFICATIONS REGARDING MULTIPLE INPUT VARIABLES

摘要

PROBLEM TO BE SOLVED: To provide a device for generating abnormal system test data capable of efficiently covering specifications regarding multiple input variables including input variables having mutually dependent relations among one another.SOLUTION: In a test data generating device 10, a variables classifying unit 15 classifies multiple input variables into groups on the basis of the presence or absence of any relation of dependence in conditional expressions to be satisfied by the multiple input variables; a value candidate generating unit 16 associates the conditional expressions with the groups to which pertinent variables belong and generates a candidate of variable values on the basis of the conditional expressions associated with the groups ; a combination generating unit 17 generates combinations of candidates, regarding each conditional expression, that out of the candidates regarding the group to which variables related to the conditional expression belong, for each candidate satisfying no conditional expression related to the pertinent group, one candidate each satisfying all the conditional expressions regarding the pertinent other group out of the other sets of variables so as to minimize the frequency of duplications of candidates selected from other groups for each combination.SELECTED DRAWING: Figure 3