发明名称 SPECTRAL MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a spectral measurement device capable of performing highly accurate analysis.SOLUTION: In a spectral measurement device 100, imaging of the same unit area of a measurement object 3 is performed a plurality of times (twice or more), and as spectral data of the measurement object 3, a plurality of times of spectral data obtained in each unit area where the measurement object 3 is imaged are integrated and averaged, thereby calculating the spectral data of the measurement object. By having a configuration in which the spectral data obtained a plurality of times in a plurality of unit areas are averaged to calculate the spectral data of the measurement object, S/N is improved and more highly accurate analysis can be performed.SELECTED DRAWING: Figure 1
申请公布号 JP2016080429(A) 申请公布日期 2016.05.16
申请号 JP20140209746 申请日期 2014.10.14
申请人 SUMITOMO ELECTRIC IND LTD 发明人 OKUNO TOSHIAKI;MORISHIMA SATORU;FUJIMOTO MIYOKO
分类号 G01N21/359;G01J3/40 主分类号 G01N21/359
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