发明名称 PROCESSING APPARATUS AND PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a processing apparatus and a processing method which can perform uniform processing.SOLUTION: A processing apparatus 1 comprises: a load port 2 where a transport container 21 housing a plurality of semiconductor wafers is placed; a dummy wafer storage area 3 where a transport container 31 housing a plurality of dummy wafers is placed; a device 71 for processing the plurality of semiconductor wafers in a state where the plurality of semiconductor wafers and dummy wafers are placed on a slot 80; and a control part 100 for controlling each part of the apparatus. The control part 100 determines whether the device 71 is not in a processing state and transfers the dummy wafer housed in the transport container 31 to the slot 80 when determines that the device 71 is not in the processing state and transfers the dummy wafer to the transport container 31 when the subsequent processing by the device 71 is set.SELECTED DRAWING: Figure 1
申请公布号 JP2016081952(A) 申请公布日期 2016.05.16
申请号 JP20140208852 申请日期 2014.10.10
申请人 TOKYO ELECTRON LTD 发明人 ITO NAOHIDE;MORISAWA DAISUKE;DEWA HIROAKI
分类号 H01L21/677;C23C16/52;H01L21/31 主分类号 H01L21/677
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