发明名称 MEASURING DEVICE, PROJECTION PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a measuring device capable of preventing a resolution power from being reduced, while enlarging a size of the measurable measurement object.SOLUTION: A three-dimensional shape measuring device (measuring device) includes: a projection part for projecting a projection pattern P having a plurality of stripes S arranged side by side; an imaging part for imaging a measurement object; and a distance calculation part for calculating a distance up to the measurement object from the projection pattern imaged by the imaging part using a triangulation method. The projection pattern P includes a plurality of periodic areas Ar formed by arranging two pairs of adjacent stripes S in a second direction D2 without overlapping each other using m×(m-1) pieces of m kinds of strips S coded by luminescence value of an m value level with m as a natural number of 3 or more. The projection pattern P is provided with a boundary line B having a luminescence value of a different level when viewed from a first direction D1, and the boundary line B is linearly formed so as to be inclined to the first direction D1 and the second direction D2 in the projection pattern P.SELECTED DRAWING: Figure 4
申请公布号 JP2016080545(A) 申请公布日期 2016.05.16
申请号 JP20140213088 申请日期 2014.10.17
申请人 RICOH CO LTD 发明人 OTA SHIORI;MASUDA KOJI;NIHEI YASUHIRO;UEDA TAKESHI;ITO MASAHIRO;OGAWA TAKESHI;TAKAHASHI SHU;TANAKA HIROMASA
分类号 G01B11/25;G06T1/00 主分类号 G01B11/25
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