发明名称 ABNORMALITY CAUSE ESTIMATING DEVICE, PICKING DEVICE, AND ABNORMALITY CAUSE ESTIMATING METHOD FOR PICKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an abnormality cause estimating device capable of rapidly identifying a cause when picking abnormality occurs, and contributing to increased efficiency of picking work by shortened recovery time.SOLUTION: A picking device 2 includes: a robot 8 which grips work-pieces one by one that are bulk loaded in a container 4; a robot controller 16; an abnormality cause estimating device 22; and take-out abnormality determining means 10. The abnormality cause estimating device 22 has three-dimensional measuring means 12 and recognition means 14. When take-out abnormality occurs, the abnormality cause estimating device 22 estimates a cause of the abnormality from initial value data of a planar region 4a of the container 4 at the time of initial setting acquired by the three-dimensional measuring means 12, and abnormality time position data of the planar region 4a.SELECTED DRAWING: Figure 1
申请公布号 JP2016078180(A) 申请公布日期 2016.05.16
申请号 JP20140212700 申请日期 2014.10.17
申请人 RICOH CO LTD 发明人 KISHIWADA JUN
分类号 B25J19/06 主分类号 B25J19/06
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