发明名称 BLOCK SLIT DEVICE AND X-RAY SCATTERING MEASUREMENT DEVICE HAVING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a block slit device with which it is possible to even more reduce the effect of scattering light on the block surface of an incident block.SOLUTION: A block slit device 100 has an incident-side block 2 having a block surface, an incident-side slit 3 disposed facing the block surface, and an emission-side block 4. The emission-side block 4 has two adjacent faces, i.e., a face A and a face B, and a ridge line 41 formed by the face A and face B exists in a plane S that includes the block surface. Furthermore, the formulas (1) and (2) below are satisfied. θ<α formula (1) 0°<β formula (2) (In formula (1), α denotes an angle (°) formed by a plane T, which includes an edge facing the incident-side block 2 of the incident-side slit 3 and the ridge line 41, and the face A, and θdenotes the total reflection critical angle (°) of incident X-rays at the face A. In formula (2), β denotes an angle (°) formed by a plane S and the face B.)SELECTED DRAWING: Figure 1
申请公布号 JP2016080450(A) 申请公布日期 2016.05.16
申请号 JP20140210284 申请日期 2014.10.14
申请人 CANON INC 发明人 TSUKAMOTO MASAMI
分类号 G01N23/201 主分类号 G01N23/201
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