发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device includes a semiconductor layer made of first conductivity type semiconductor layer; a second conductivity type well region formed on the semiconductor layer and having a channel region; a first conductivity type source region formed on the well region and including a first region adjacent to the well region and a second region adjacent to the first region; a gate insulating film formed on the semiconductor layer and having a first portion that contacts the first region; a second portion that contacts the well region and that has a thickness that is the same as that of the first portion; and a third portion that contacts the second region and that has a thickness that is greater than that of the first portion; and a gate electrode formed on the gate insulating film and opposed to the channel region where a channel is formed through the gate insulating film. |
申请公布号 |
US2016133743(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
US201614995454 |
申请日期 |
2016.01.14 |
申请人 |
ROHM CO., LTD. |
发明人 |
MITANI Shuhei;NAKANO Yuki;WATANABE Heiji;SHIMURA Takayoshi;HOSOI Takuji;KIRINO Takashi |
分类号 |
H01L29/78;H01L29/423;H01L29/417;H01L29/10 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device, comprising:
a semiconductor layer that is a first conductivity type semiconductor layer; a well region that is a second conductivity type well region formed on a surface layer portion of the semiconductor layer and that has a channel region defined therein; a source region that is a first conductivity type source region formed on a surface layer portion of the well region and that includes a first region defined adjacent to the well region and a second region defined adjacent to the first region; a gate insulating film formed on the semiconductor layer and having defined therein:
a first portion that contacts the first region of the source region;a second portion that contacts the well region and that has a thickness that is the same as that of the first portion; anda third portion that contacts the second region of the source region and that has a thickness that is greater than that of the first portion; and a gate electrode formed on the gate insulating film and opposed to the channel region of the well region where a channel is formed through the gate insulating film. |
地址 |
Kyoto JP |