发明名称 Temperature Measurement Circuitry and Method
摘要 A method includes alternately coupling a selected one of a plurality of current sources and two or more of the plurality of current sources to a first terminal of a bipolar device during first and second phases of a modulator cycle of a plurality of modulator cycles. The method further includes providing sampled voltages from the first terminal of the bipolar device to a modulator to produce a modulator output signal, filtering the modulator output signal to produce a filtered output signal using a back-end filter having an impulse response, and determining a temperature in response to the filtered output signal.
申请公布号 US2016131536(A1) 申请公布日期 2016.05.12
申请号 US201514983419 申请日期 2015.12.29
申请人 Silicon Laboratories Inc. 发明人 Welland David R.
分类号 G01K7/01;G01K7/34 主分类号 G01K7/01
代理机构 代理人
主权项 1. A method comprising: controlling a current source circuit including a plurality of current sources to alternately couple a selected one of the plurality of current sources and two or more of the plurality of current sources to a first input of a bipolar device during first and second phases of a modulator cycle of a plurality of modulator cycles; sampling voltages from the first input of the bipolar device using a sampling circuit; providing sampled voltages from the sampling circuit to an input of a modulator configured to produce a modulator output signal based on the sampled voltages; filtering the modulator output signal to produce a filtered output signal using a back-end filter having a programmable impulse response; and determining, using a temperature determination circuit, a temperature in response to the filtered output signal.
地址 Austin TX US
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