发明名称 |
Temperature Measurement Circuitry and Method |
摘要 |
A method includes alternately coupling a selected one of a plurality of current sources and two or more of the plurality of current sources to a first terminal of a bipolar device during first and second phases of a modulator cycle of a plurality of modulator cycles. The method further includes providing sampled voltages from the first terminal of the bipolar device to a modulator to produce a modulator output signal, filtering the modulator output signal to produce a filtered output signal using a back-end filter having an impulse response, and determining a temperature in response to the filtered output signal. |
申请公布号 |
US2016131536(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
US201514983419 |
申请日期 |
2015.12.29 |
申请人 |
Silicon Laboratories Inc. |
发明人 |
Welland David R. |
分类号 |
G01K7/01;G01K7/34 |
主分类号 |
G01K7/01 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method comprising:
controlling a current source circuit including a plurality of current sources to alternately couple a selected one of the plurality of current sources and two or more of the plurality of current sources to a first input of a bipolar device during first and second phases of a modulator cycle of a plurality of modulator cycles; sampling voltages from the first input of the bipolar device using a sampling circuit; providing sampled voltages from the sampling circuit to an input of a modulator configured to produce a modulator output signal based on the sampled voltages; filtering the modulator output signal to produce a filtered output signal using a back-end filter having a programmable impulse response; and determining, using a temperature determination circuit, a temperature in response to the filtered output signal. |
地址 |
Austin TX US |