发明名称 FINE PARTICLE MEASUREMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve the measurement accuracy of the fine particle amount in a fine particle measurement system.SOLUTION: The fine particle measurement system includes: an ion generation unit for generating ions by corona discharge; an electrification chamber for electrifying fine particles in a gas to be measured; a measurement signal generation circuit for generating a measurement signal correlated with the fine particle amount; a fine particle amount determination unit for determining the fine particle amount; and a particle size estimation unit for estimating the particle size of the fine particles in the gas to be measured. The fine particle amount determination unit performs correction by multiplying the measurement signal or the fine particle amount determined from the measurement signal by a coefficient related to the ratio between the estimated particle size and a reference particle size.SELECTED DRAWING: Figure 11
申请公布号 JP2016075674(A) 申请公布日期 2016.05.12
申请号 JP20150190528 申请日期 2015.09.29
申请人 NGK SPARK PLUG CO LTD 发明人 MATSUOKA TOSHIYA;SUGIYAMA TAKESHI
分类号 G01N27/68 主分类号 G01N27/68
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