SCAN THROUGHPUT ENHANCEMENT IN SCAN TESTING OF A DEVICE-UNDER-TEST

摘要

Systems and methods for enabling scan testing of device-under-test (DUT) are disclosed. In an embodiment, a test system for scan testing the DUT, including P scan input ports and Q scan output ports, includes tester and adapter module. Tester operates at clock frequency F1 and includes M tester Input/Output (I/O) ports for providing M scan inputs and N tester I/O ports for receiving N scan outputs at F1. Adapter module is coupled to tester and configured to receive M scan inputs at F1 and, in response, provide P scan inputs at clock frequency F2 to P scan input ports, and to receive Q scan outputs at F2 from Q scan output ports and, in response, provide N scan outputs at F1 to N tester I/O ports, where ratio of M to P equals ratio of N to Q, and where each of M, N, P and Q are positive integers.

主权项

1. A test system for scan testing a device-under-test (DUT), the DUT comprising P scan input ports and Q scan output ports, the test system comprising:
a tester configured to operate at a clock frequency F1, the tester comprising:
M tester Input/Output(I/O) ports for providing M scan inputs at the clock frequency F1; andN tester I/O ports for receiving N scan outputs at the clock frequency F1; and an adapter module coupled to the tester, the adapter module configured to:
receive the M scan inputs at the clock frequency F1 and provide P scan inputs at a clock frequency F2 to the P scan input ports of the DUT, the P scan inputs provided in response to the M scan inputs; andreceive Q scan outputs at the clock frequency F2 from the Q scan output ports of the DUT and provide the N scan outputs at the clock frequency F1 to the N tester I/O ports of the tester, the N scan outputs provided in response to the Q scan outputs, wherein a ratio of M to P is equal to a ratio of N to Q, and wherein each of M, N, P and Q is a positive integer.