TEST OF SEMICONDUCTOR STORAGE POWER CONSUMPTION ON BASIS OF EXECUTED ACCESS COMMANDS

摘要

The present invention extends to methods, systems, and computer program products for testing storage device power circuitry (113). A storage device controller (102) includes an embedded test program (104). The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns (107A,..., 107C) to test shared power circuitry (113) of storage device components (e.g., shared by an array of NAND flash memory devices (108A,..., 108C)). The test program identifies a command pattern (107) that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.