| 摘要 |
An apparatus is presented. The apparatus includes a first circuit configured to predict temperatures of a location for a plurality of time instances based on measured temperatures and a second circuit configured to schedule a thermal mitigation function based on the predicted temperatures. A method of operating an apparatus is presented. The method includes measuring temperatures on an integrated circuit, predicting temperatures of a location for a plurality of time instances based on the measured temperatures, and scheduling a thermal mitigation function based on the predicted temperatures. An apparatus is presented. The apparatus includes means for measuring temperatures on an integrated circuit, means for predicting temperatures of a location for a plurality of time instances based on measured temperatures, and means for scheduling a thermal mitigation function based on the predicted temperatures. |
