发明名称 |
BOTTOM-UP ELECTROLYTIC VIA PLATING METHOD |
摘要 |
Disclosed herein is a bottom-up electrolytic via plating method wherein a first carrier substrate (100) and a second substrate (110) having at least one through-via (120) are temporarily bonded together. The method includes applying a seed layer (108) on a surface of the first substrate, forming a surface modification layer (114) on the seed layer or the second substrate, bonding the second substrate to the first substrate with the surface modification layer to create an assembly wherein the seed layer and the surface modification layer are disposed between the first and second substrates, applying conductive material (122) to the through-via, removing the second substrate having the through-via containing conductive material from the assembly. |
申请公布号 |
WO2016073658(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
WO2015US59126 |
申请日期 |
2015.11.05 |
申请人 |
CORNING INCORPORATED |
发明人 |
BELLMAN, ROBERT ALAN;KEECH, JOHN TYLER;KUKSENKOVA, EKATERINA ALEKSANDROVNA;POLLARD, SCOTT CHRISTOPHER |
分类号 |
H01L21/768;H01L21/48;H01L23/15 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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