发明名称 METHOD FOR MEASURING TEMPERATURE BY REFRACTION AND CHANGE IN VELOCITY OF WAVES WITH MAGNETIC SUSCEPTIBILITY
摘要 Methods and apparatuses for determining in-situ a temperature of a substrate with a thermal sensor in a vacuum chamber are described herein. In one embodiment a thermal sensor has a transmitter configured to transmit electromagnetic waves, a receiver configured to receive electromagnetic waves, and a controller configured to control the transmitter and receiver, wherein the controller determines a temperature from a difference between the transmitted electromagnetic wave and the received electromagnetic wave.
申请公布号 US2016131539(A1) 申请公布日期 2016.05.12
申请号 US201414534563 申请日期 2014.11.06
申请人 Applied Materials, Inc. 发明人 SHEELAVANT Gangadhar
分类号 G01K11/00 主分类号 G01K11/00
代理机构 代理人
主权项 1. A thermal sensor, comprising: a transmitter configured to transmit electromagnetic waves; a receiver configured to receive electromagnetic waves; and a controller configured to control the transmitter and receiver, wherein the controller is operable to determine a temperature from a difference between the transmitted electromagnetic wave and the received electromagnetic wave.
地址 Santa Clara CA US