发明名称 |
METHOD FOR MEASURING TEMPERATURE BY REFRACTION AND CHANGE IN VELOCITY OF WAVES WITH MAGNETIC SUSCEPTIBILITY |
摘要 |
Methods and apparatuses for determining in-situ a temperature of a substrate with a thermal sensor in a vacuum chamber are described herein. In one embodiment a thermal sensor has a transmitter configured to transmit electromagnetic waves, a receiver configured to receive electromagnetic waves, and a controller configured to control the transmitter and receiver, wherein the controller determines a temperature from a difference between the transmitted electromagnetic wave and the received electromagnetic wave. |
申请公布号 |
US2016131539(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
US201414534563 |
申请日期 |
2014.11.06 |
申请人 |
Applied Materials, Inc. |
发明人 |
SHEELAVANT Gangadhar |
分类号 |
G01K11/00 |
主分类号 |
G01K11/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A thermal sensor, comprising:
a transmitter configured to transmit electromagnetic waves; a receiver configured to receive electromagnetic waves; and a controller configured to control the transmitter and receiver, wherein the controller is operable to determine a temperature from a difference between the transmitted electromagnetic wave and the received electromagnetic wave. |
地址 |
Santa Clara CA US |