发明名称 TEMPERATURE DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
摘要 Provided is a temperature detection circuit having less manufacturing fluctuations in detection temperature and capable of easily adjusting the manufacturing fluctuations in detection temperature. The temperature detection circuit includes: a constant current circuit configured to output a constant current; a voltage-controlled current circuit, which is controlled by a voltage output from a heat sensitive element and is configured to output a current corresponding to temperature; and a current comparator configured to compare the constant current and the current corresponding to temperature, and output a detection signal indicating that a predetermined temperature is detected. Temperature characteristics of the constant current circuit and temperature characteristics of the voltage-controlled current circuit have a correlation with each other. The temperature detection circuit is configured to detect temperature based on a result of comparing the output current of the constant current circuit and the output current of the voltage-controlled current circuit.
申请公布号 US2016131535(A1) 申请公布日期 2016.05.12
申请号 US201514934323 申请日期 2015.11.06
申请人 Seiko Instruments Inc. 发明人 NAKASHIMO Takao
分类号 G01K7/01;H02H5/04 主分类号 G01K7/01
代理机构 代理人
主权项 1. A temperature detection circuit, comprising: a constant current circuit configured to output a constant current; a heat sensitive element; a voltage-controlled current circuit, which is controlled by a voltage output from the heat sensitive element and configured to output a current corresponding to temperature; and a current comparator configured to compare the constant current and the current corresponding to temperature, and output a detection signal indicating that a predetermined temperature is detected, wherein temperature characteristics of the constant current circuit and temperature characteristics of the voltage-controlled current circuit have a correlation with each other.
地址 Chiba-shi JP