发明名称 METHOD FOR ION IMPLANTATION
摘要 A method for an ion implantation is provided. First, a non-parallel ion beam is provided. Thereafter, a relative motion between a workpiece and the non-parallel ion beam, so as to enable each region of the workpiece to be implanted by different portions of the non-parallel ion beam successively. Particularly, when at least one three-dimensional structure is located on the upper surface of the workpiece, both the top surface and the side surface of the three-dimensional structure may be implanted properly by the non-parallel ion beam when the workpiece is moved across the non-parallel ion beam one and only one times. Herein, the non-parallel ion beam can be a divergent ion beam or a convergent ion beam (both may be viewed as the integrated divergent beam), also can be generated directly from an ion source or is modified from a parallel ion beam, a divergent ion beam or a convergent ion beam.
申请公布号 US2016133469(A1) 申请公布日期 2016.05.12
申请号 US201514752522 申请日期 2015.06.26
申请人 ADVANCED ION BEAM TECHNOLOGY, INC. 发明人 WAN Zhimin;SAADATMAND Kourosh;PLATOW Wilhelm P.;LIN Ger-Pin;LI Ching-I;PADMANABHA Rekha;CAI Gary N.
分类号 H01L21/265 主分类号 H01L21/265
代理机构 代理人
主权项 1. A method for an ion implantation, comprising: providing a non-parallel ion beam; and generating a relative motion between a workpiece and the non-parallel ion beam, so as to enable each region of the workpiece to be implanted by different portions of the non-parallel ion beam successively; wherein the non-parallel ion beam is a divergent ion beam or a convergent ion beam.
地址 Hsinchu TW