发明名称 |
AUTOMATED DEFECT DIAGNOSIS FROM MACHINE DIAGNOSTIC DATA |
摘要 |
Diagnosis of defect(s) in a system is disclosed. A defect signature-based query is performed against system diagnostic data stored in one or more structured records. It is determined that a defect signature is associated with a system based at least in part on the query. Remediation information generated based at least in part on the defect signature and the system diagnostic data may be output. |
申请公布号 |
US2016132377(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
US201614997980 |
申请日期 |
2016.01.18 |
申请人 |
EMC Corporation |
发明人 |
Chamness Mark;Schnegelberger Eric |
分类号 |
G06F11/07;G06F17/30 |
主分类号 |
G06F11/07 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of generating defect signatures, comprising:
processing, by a processor, received defect symptom data into one or more defect symptom records; determining whether the received defect symptom data is associated with an existing defect signature; and in the event the received defect symptom data is not associated with an existing defect signature, generating a new defect signature. |
地址 |
Hopkinton MA US |