发明名称 AUTOMATED DEFECT DIAGNOSIS FROM MACHINE DIAGNOSTIC DATA
摘要 Diagnosis of defect(s) in a system is disclosed. A defect signature-based query is performed against system diagnostic data stored in one or more structured records. It is determined that a defect signature is associated with a system based at least in part on the query. Remediation information generated based at least in part on the defect signature and the system diagnostic data may be output.
申请公布号 US2016132377(A1) 申请公布日期 2016.05.12
申请号 US201614997980 申请日期 2016.01.18
申请人 EMC Corporation 发明人 Chamness Mark;Schnegelberger Eric
分类号 G06F11/07;G06F17/30 主分类号 G06F11/07
代理机构 代理人
主权项 1. A method of generating defect signatures, comprising: processing, by a processor, received defect symptom data into one or more defect symptom records; determining whether the received defect symptom data is associated with an existing defect signature; and in the event the received defect symptom data is not associated with an existing defect signature, generating a new defect signature.
地址 Hopkinton MA US