发明名称 |
MEMORY DEVICE WITH SECURE TEST MODE AND METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a system for achieving the security of a memory device in a testing mode.SOLUTION: A method in a memory device that operates in a testing mode includes the steps of: receiving a vector to be written to the memory device; writing the vector to the memory device only if the vector belongs to a predefined set of test vectors; and converting the vector to one of the test vectors and writing the converted vector to the memory device if the vector does not belong to the set of the test vectors.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016076261(A) |
申请公布日期 |
2016.05.12 |
申请号 |
JP20150251085 |
申请日期 |
2015.12.24 |
申请人 |
HUABANG ELECTRONIC CO LTD |
发明人 |
NIR TASHER;URI KALUZHNY;TSACHI WEISER;VALERY TEPER |
分类号 |
G06F12/16;G06F21/60;G11C29/10 |
主分类号 |
G06F12/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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