发明名称 HIGHLY RELIABLE NONVOLATILE SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage device that suppresses deterioration of reliability due to the rewriting of data.SOLUTION: A method for erasing a NAND type flash memory includes: holding a control gate at 0 V; discharging electrons from a floating gate to a P well 14 by applying a high-voltage erasure pulse Ps to the P well 14; then, holding the control gate at 0 V again; and applying a weak erasure pulse Pw having a voltage lower than that of the erasure pulse Ps, to the P well 14.SELECTED DRAWING: Figure 8
申请公布号 JP2016076280(A) 申请公布日期 2016.05.12
申请号 JP20140204065 申请日期 2014.10.02
申请人 WINBOND ELECTRONICS CORP 发明人 SHIRATA RIICHIRO
分类号 G11C16/02;G11C16/04 主分类号 G11C16/02
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