| 摘要 |
PROBLEM TO BE SOLVED: To provide a preparation method of an observation sample allowing particles with a specific average particle diameter which makes observation with an electron microscope difficult to be easily observed with the electron microscope, and a method for observing the particles with the electron microscope by using the observation sample.SOLUTION: Particles 1 whose average particle diameter is more than 100 nm and equal to or less than 100 μm are pressed together with tin 2, so that an observation sample having a part in which the particles 1 and the tin 2 contact with each other is prepared. The observation sample is observed with an electron microscope, so that the particles 1 are observed.SELECTED DRAWING: Figure 1 |
