发明名称 TEST APPARATUS, TEST SYSTEM AND OPERATING METHOD OF TEST APPARATUS
摘要 A test system may include: a vector storage unit suitable for storing a first test vector corresponding to a first test operation; a test target suitable for performing a test operation corresponding to the test vector stored in a vector storage unit; a comparison unit suitable for comparing a first test result to an expected value to output a first test result value, wherein the first test result is transferred from the test target as a result of the first test operation based on the first test vector; and a vector control unit suitable for modifying the first test vector to generate a second test vector corresponding to a second test operation.
申请公布号 US2016133339(A1) 申请公布日期 2016.05.12
申请号 US201514732281 申请日期 2015.06.05
申请人 SK hynix Inc. 发明人 LEE Yong-Woo
分类号 G11C29/38;G11C29/18 主分类号 G11C29/38
代理机构 代理人
主权项 1. A test system comprising: a vector storage unit suitable for storing a first test vector corresponding to a first test operation; a test target suitable for performing a test operation corresponding to a test vector stored in the vector storage unit; a comparison unit suitable for comparing a first test result to an expected value to output a first test result value, wherein the first test result is transferred from the test target as a result of the first test operation based on the first test vector; and a vector control unit suitable for modifying the first test vector to generate a second test vector corresponding to a second test operation.
地址 Gyeonggi-do KR