发明名称 |
TEST APPARATUS, TEST SYSTEM AND OPERATING METHOD OF TEST APPARATUS |
摘要 |
A test system may include: a vector storage unit suitable for storing a first test vector corresponding to a first test operation; a test target suitable for performing a test operation corresponding to the test vector stored in a vector storage unit; a comparison unit suitable for comparing a first test result to an expected value to output a first test result value, wherein the first test result is transferred from the test target as a result of the first test operation based on the first test vector; and a vector control unit suitable for modifying the first test vector to generate a second test vector corresponding to a second test operation. |
申请公布号 |
US2016133339(A1) |
申请公布日期 |
2016.05.12 |
申请号 |
US201514732281 |
申请日期 |
2015.06.05 |
申请人 |
SK hynix Inc. |
发明人 |
LEE Yong-Woo |
分类号 |
G11C29/38;G11C29/18 |
主分类号 |
G11C29/38 |
代理机构 |
|
代理人 |
|
主权项 |
1. A test system comprising:
a vector storage unit suitable for storing a first test vector corresponding to a first test operation; a test target suitable for performing a test operation corresponding to a test vector stored in the vector storage unit; a comparison unit suitable for comparing a first test result to an expected value to output a first test result value, wherein the first test result is transferred from the test target as a result of the first test operation based on the first test vector; and a vector control unit suitable for modifying the first test vector to generate a second test vector corresponding to a second test operation. |
地址 |
Gyeonggi-do KR |