发明名称 SELF-TESTING DATA STORAGE DEVICES AND METHODS
摘要 Systems and methods for self-testing archival memory devices are described. The memory device includes a data storage component capable of being coded with data. The memory device further includes a read-write mechanism configured to read, write, and delete data stored on the data storage component. The memory device includes a read-write controller configured to control the read-write mechanism based on input received through a device interface of the memory device, wherein the device interface of the memory device is configured to connect to an external computing device. The memory device further includes a diagnostic controller configured to perform a test on at least one of the data stored on the data storage component, the data storage component, and the read-write mechanism. The memory device includes a power source configured to provide operational power to the diagnostic controller when the memory device is not connected to an external power source.
申请公布号 US2016133338(A1) 申请公布日期 2016.05.12
申请号 US201514683998 申请日期 2015.04.10
申请人 Elwha LLC 发明人 Bowers Jeffrey A.;Hagelstein Peter L.;Hyde Roderick A.;Ishikawa Muriel Y.;Kare Jordin T.;Wood,, JR. Lowell L.;Wood Victoria Y.H.
分类号 G11C29/38;G11C29/44;G01N27/72;G01N27/12;G01K1/02;G01H1/00 主分类号 G11C29/38
代理机构 代理人
主权项 1. A method of testing a data storage system in an archival state, the method comprising: powering a diagnostic controller of the data storage system with a power source of the storage system, wherein the data storage system is configured to be connected to a computing device; detecting, by the diagnostic controller, a trigger event; performing, by the diagnostic controller and based on detection of the trigger event, a test on the data storage system; and determining a result of the test; wherein the diagnostic controller is separate from the computing device.
地址 Bellevue WA US