发明名称 ELECTROSTATIC DISCHARGE PROTECTION STRUCTURE AND METHOD
摘要 A semiconductor package comprises an upper package, and a lower package having a plurality of fan-out mutual connection structures. A plurality of connectors between packages are placed in a gap between the upper package and the lower package. A conductive protection layer is formed on the semiconductor package, and seals a gap around the edge of the semiconductor package. Also, the conductive protection layer covers the upper surface and a side wall of the upper package, and also covers part of the upper surface of the lower package extended as passing the boundary between the upper part of a side wall of the lower package and the upper package. Therefore, proper protection against electrostatic discharge can prevent circuits inside the packages from easily being damaged.
申请公布号 KR20160051656(A) 申请公布日期 2016.05.11
申请号 KR20150151725 申请日期 2015.10.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN HSIEN WEI;CHEN JIE
分类号 H01L25/07;H01L21/56;H01L23/28;H01L25/065 主分类号 H01L25/07
代理机构 代理人
主权项
地址