发明名称 回路においてスナップバック事象を検知するための装置、デバイスおよび方法
摘要 Example subject matter disclosed herein relates to apparatuses and/or devices, and/or various methods for use therein, in which an application of an electric potential to a circuit may be initiated and subsequently changed in response to a determination that a snapback event has occurred in a circuit. For example, a circuit may comprise a memory cell that may experience a snapback event as a result of an applied electric potential. In certain example implementations, a sense circuit may be provided which is responsive to a snapback event occurring in a memory cell to generate a feed back signal to initiate a change in an electric potential applied to the memory cell.
申请公布号 JP5914659(B2) 申请公布日期 2016.05.11
申请号 JP20140526265 申请日期 2012.08.17
申请人 マイクロン テクノロジー, インク. 发明人 ハースト,ジェレミー;カストロ,エー.ハーナン;タン,スティーヴン
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
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