发明名称 酸化物半導体膜の作製方法
摘要 An object is to provide an oxide semiconductor layer having a novel structure which is preferably used for a semiconductor device. Alternatively, another object is to provide a semiconductor device using an oxide semiconductor layer having the novel structure. An oxide semiconductor layer includes an amorphous region which is mainly amorphous and a crystal region containing crystal grains of In2Ga2ZnO7 in a vicinity of a surface, in which the crystal grains are oriented so that the c-axis is almost vertical with respect to the surface. Alternatively, a semiconductor device uses such an oxide semiconductor layer.
申请公布号 JP5916817(B2) 申请公布日期 2016.05.11
申请号 JP20140167289 申请日期 2014.08.20
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;坂倉 真之;宮永 昭治;高橋 正弘;廣橋 拓也;島津 貴志
分类号 H01L29/786;H01L21/20 主分类号 H01L29/786
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