| 摘要 |
Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuses. At least one portion of the electrical fuse can have at least one extended area to accelerate programming. The program selector can be a diode or MOS that can be turned on through the channel or the source/drain junction. The OTP device can have the at least one OTP element coupled to at least one diode in a memory cell. A method of programming electrical fuses reliably is also disclosed. Advantageously, by controlled programming where programming current is maintained below a critical current, programming is reliable. In another embodiment, a programmable resistive device cell can use at least one MOS device as selector which can be programmed or read by turning on a source junction diode of the MOS or a channel of the MOS. |
