| 摘要 |
The method for testing a passive infrared sensor, the sensor comprising a housing in which an infrared sensor element with two terminal pins and a circuitry connected to the terminal pins of the infrared sensor element are arranged, the method comprises the steps of repeatedly generating and applying individual known electric charges to one of the terminal pins (26, 28) with a predetermined frequency per time unit and measuring the voltage between the two terminal pins (26, 28), and indicating failure of the passive infrared sensor (10) if the voltage differs from a desired voltage by more than a predetermined value. |
